Web22 mei 2012 · The current computing power of commonly employed desktop computers often requires data to be reduced (binned) for MCR image analysis. This limits the potential to analyse multiple samples or mm-scale regions at high resolution, which can be routinely achieved using the stage scan ‘image stitching’ functionality of SurfaceLab 6 (IONTOF … WebTo our valued customers: Just in time for our Virtual IONTOF User School starting tomorrow, we have released SurfaceLab 7.3 Bugfixing Release 1. This version…
IONTOF - TOF-SIMS (time of flight secondary ion mass …
Webfrom Bruker Daltonics, TissueView from AB Sciex, SurfaceLab from IonTof), and to very few free-of-charge software, such as BioMap or MITICS.32 If all these software tools provide image WebSurfaceLab 7 is the most recent instrument operation, data acquisition and data analysis software for all IONTOF instruments. With this versatile software package IONTOF … etown distributing
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Web2 sep. 2024 · Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a powerful tool for surface analysis, but fragmentation of molecular species during the SIMS process may lead to complex mass spectra. Web14 dec. 2024 · For the MS/MS analyses, the Hybrid SIMS is used (IONTOF GmbH, Münster, Germany), which is a combination of a typical ToF-SIMS instrument with an orbital trapping mass spectrometer (Q Exactive HF, ThermoFisher Scientific GmbH, Bremen, Germany). ToF-SIMS ion images are recorded and analyzed using the SurfaceLab 7 (IONTOF) … WebIV instrument (IONTOF) using 25 ‐kV Bi1+ primary ions. The analyses were conducted at a pressure of 10 −9 mbar in the spectrometry mode of the instrument (i.e., high ‐current bunched mode) with a field of view of 100×100µm 2.Ele-mental and molecular information from the analyzed sample surface were acquired by setting the detector in the etown distributing elizabethtown ky